Examples of 'ellipsometry' in a sentence
Meaning of "ellipsometry"
Ellipsometry (noun): A scientific technique used to measure the thickness and optical properties of thin films and surfaces through the analysis of changes in polarized light
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- An optical technique for the investigation of the dielectric properties of thin films especially used in semiconductor manufacture.
How to use "ellipsometry" in a sentence
Basic
Advanced
ellipsometry
Imaging ellipsometry is based on the concept of nulling.
This study is carried out mainly by ellipsometry.
Ellipsometry measures an intensity ratio instead of pure intensities.
This glass was characterised in ellipsometry and in transmission.
Polarimetry of thin films and surfaces is known as ellipsometry.
Ellipsometry measurements were then taken to measure photoexpansion of the films.
Film thickness and uniformity were veri ed by ellipsometry.
Thus a spectroscopic ellipsometry is concerned.
Composition of the films was controlled by ellipsometry.
From the results of ellipsometry emission obtained by the stokes parameters.
Resulting layer thickness was analyzed by ellipsometry.
Ellipsometry is a technique that is often used to measure properties of thin films.
Remaining layer thickness was determined by ellipsometry.
The conventional phase modulation ellipsometry can then be implemented.
The optical properties of the materials werestudied by spectroscopic ellipsometry.
See also
Conventional ellipsometry and goniometry devices use cumbersome measurement arms.
Films are studied by spectroscopic ellipsometry.
Ellipsometry allows the physical properties of a sample to be determined by optical measurement.
The apparent surface mass density of proteins was evaluated by ellipsometry.
The results of the spectroscopic ellipsometry were a clear indication of a nanoporous film.
The action of the plasma on the sample is followed by ellipsometry.
Ellipsometry at the nanoscale.
The refractive index may for example be determined by ellipsometry.
Absorbance measurements and ellipsometry may be used to determine polymer film thickness.
The films were characterised by ellipsometry.
Ellipsometry in summary.
Sensing can also be carried out using spectroscopic ellipsometry.
Ellipsometry is a powerful technique for the measurement of the optical properties of a uniform surface.
The thickness can advantageously be measured by ellipsometry on silicon wafers.
Ellipsometry is a specular optical technique the angle of incidence equals the angle of reflection.
Like the vast majority of optical techniques the ellipsometry is nondestructive.
Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.
The swelling of chains and force ionic effect were studied by ellipsometry.
Ellipsometry measurements were performed in all samples for proper characterization of molecular layer thickness.
Known dimensional inspection methods are methods of scatterometry by ellipsometry and by photogoniometry.
Combination with ellipsometry on a rotating disc is therefore a preferred embodiment of the present invention.
The thickness and refraction index of the layer were measured by ellipsometry.
Spectroscopic ellipsometry allows determining the thickness of the layer and its refractive index.
The quantification of crystalline fractions can be obtained by spectroscopic ellipsometry measures.
Results demonstrate that ellipsometry is sensitive to the formation of domains including epitaxial diamond crystals.
Different methods such as scanning electron microscopy and spectroscopic ellipsometry have been tested.
Ellipsometry and atomic force microscopy can be used to define the film thickness and homogeneity.
We have also studied nanostructred layers made of ovoid cobalt particles by generalized ellipsometry.
The object of ellipsometry is therefore to measure the parameters ψ and A for a given surface.
The thickness and homogeneity of the layer is determined by ellipsometry or atomic force microscopy.
Typically, ellipsometry is done only in the reflection setup.
The thickness and optical properties of the adsorbed protein layers were evaluated by spectroscopic ellipsometry.
The films are characterised by ellipsometry and IR Fourier spectroscopy.
The index and thickness are measured by UV-Visible ellipsometry.
Choosing reflectometry and ellipsometry methods of calculation ;.
