Examples of 'focused ion' in a sentence
Meaning of "focused ion"
focused ion: In the context of science or technology, refers to a type of ion beam that has been concentrated or directed towards a specific target or area for research or experimentation. This phrase is commonly used in scientific discussions or studies involving ion beams.
How to use "focused ion" in a sentence
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focused ion
Our goals are focused ion the following fundamental aspects.
Fibx custommultiple output powersupply for focused ion beam.
Focused ion beams have a Gaussian profile.
Semiconductor thin sections can be made using a focused ion beam.
HARTING also acquired a focused ion beam for material analysis.
Permitting a very rapid change of the optical aperture of the focused ion column.
The specific geometries are produced by focused ion milling crystalline gold platelets.
Focused ion beam installation comprising,.
It is not necessary to dispose of specific focused ion beam devices for example.
Focused ion beams have a Gaussian profile . As a result, the pores have sloping sidewalls.
Spatial distribution information is obtained by scanning a micro focused ion beam across the sample surface.
Focused ion beam methods were developed to cut samples measuring less than 100 microns in size.
The Nanofib project is developing a focused ion beam technique.
FIG . 1 shows a focused ion beam installation 1 according to the invention.
The method of claim 6, wherein scanning means are used to move the focused ion beam.
See also
The invention also concerns a focused ion beam installation comprising,.
It is made from platinum-coated silicon nitride, and was illustrated using a focused ion beam.
The invention additionally comprises a focused ion beam installation comprising,.
The method of Claim 12, wherein the gemstone or diamond is irradiated using a focused ion beam.
High-quality patterns were fabricated by focused ion beam lithography and reactive ion etching.
Finally, the dielectric material of the protective layers makes attacks by focused ion beam difficult.
A less traditional technique is to use focused ion beam sputtering ( FIB ) to remove material.
FIG . 6 graphically demonstrates the dramatic improvement in sharpness resulting from focused ion beam milling.
FIG . 1 illustrates a focused ion beam installation according to the invention.
Lamellas for TEM investigations were cut from kaolinite samples with a Focused Ion Beam ( FIB ).
Fig . 4 shows a focused ion beam-transmission electron micrograph of the coating film of Comparative Example 4.
The cutting edge blanks 30, then are loaded into a vacuum chamber of a focused ion beam mill.
Gallium focused ion beam (FIB) was integrated into Leti's ToF-SIMS spectrometer at its Nanocharacterization platform.
Another method is ion-beam-induced deposition ( IBID ), where a focused ion beam is applied instead.
TEM-ready samples is prepared by focused ion beam ( FIB ) milling.
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