Examples of 'force microscopy' in a sentence
Meaning of "force microscopy"
A technique in physics and materials science that allows the measurement of surface properties on a nanometer scale using a probe
How to use "force microscopy" in a sentence
Basic
Advanced
force microscopy
Topographic imaging is achieved using force microscopy.
Scanning force microscopy simulations of nanoparticles on insulating surfaces.
Imaging of viruses by atomic force microscopy.
Several atomic force microscopy techniques can be used.
Other experiments were carried out by atomic force microscopy.
Magnetic force microscopy or handheld magnetic readers can be used.
We used atomic force microscopy to.
The morphology of the films was characterized by atomic force microscopy.
Atomic force microscopy.
Monolayer coatings were characterized with atomic force microscopy.
Stretching barnase by atomic force microscopy and molecular dynamics simulation.
Studies of thin film surfaces using atomic force microscopy.
Scanning force microscopy.
Lets take a look at the technique of atomic force microscopy.
The atomic force microscopy was performed in the normal tapping mode.
See also
Understanding magnetic force microscopy.
Atomic force microscopy was performed to view the morphology of the three membranes.
Nanorheology by atomic force microscopy.
Imaging by atomic force microscopy revealed the importance of the surface in the degradation phenomenon.
Qualitative analysis of the resin surface was performed by atomic force microscopy.
The team used atomic force microscopy with very good results.
Covalent functionalization with an antibody of a tip for scanning force microscopy.
The atomic force microscopy in general and the particular behavior of these oscillators is described.
Surface morphologies and growth mode were analysed by atomic force microscopy.
They also established traction force microscopy to measure the forces exerted by the cells.
Method and structure for characterising an atomic force microscopy tip.
Atomic force microscopy may be used to confirm that dried primer layers are substantially continuous.
Their main research tool is single molecule atomic force microscopy.
Since the development of atomic force microscopy many modes and related techniques have emerged.
Our main research tool is single molecule atomic force microscopy.
Conductive scanning force microscopy measurements confirmed the presence of conductive paths within the composite.
By scanning and transmission electron microscopy and atomic force microscopy.
Ellipsometry and atomic force microscopy can be used to define the film thickness and homogeneity.
Nanocharacterization of surfaces and biointerfaces by atomic force microscopy coupled with fluorescence.
Using atomic force microscopy the Lee group monitored the interactions of antimicrobial peptides with biomembranes.
The strain variations at microscopic scale was also determined by using atomic force microscopy.
Conductive scanning force microscopy measurements FIG.
The patterned substrate was imaged by scanning electron microscopy and atomic force microscopy.
Lateral force microscopy In base configuration.
The thickness and homogeneity of the layer is determined by ellipsometry or atomic force microscopy.
The surface topography of fibers was analyzed by atomic force microscopy and scanning electron microscope.
A general model for amyloid fibril assembly based on morphological studies using atomic force microscopy.
Without cantilever transducers, atomic force microscopy would not be possible.
The particle morphology can be measured using scanning electron microscopy and atomic force microscopy.
Atomic force microscopy elucidated the evolution of cauliflower-like surface morphology.
The coated stents were also characterised for their total coating thickness using atomic force microscopy.
The electric force microscopy ( efm ) measurements enabled the study of charge transfer.
The ferroelectric properties of the PLD films are studied by the piezoresponse force microscopy.
Fig . 7 is an atomic force microscopy image of a typical single wall nanotube detector device.
The permanent deformation volumes around Vickers indents were investigated through atomic force microscopy.
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